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原位电镜观测氧化石墨烯的加热还原过程

白天琦#，黄 坤#，杜进隆*，裴嵩峰*，高 鹏*
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2024年 第43卷 第4期:  1000-6281（2024）04-405-008     下载地址：

原位电镜观测氧化石墨烯的加热还原过程

白天琦#，黄  坤#，杜进隆*，裴嵩峰*，高  鹏*

（1.北京大学电子显微镜实验室，北京100871；2.北京大学前沿交叉学科研究院，北京100871；3.北京石墨烯研究院，北京100095；4.中国科学院金属研究所，沈阳材料科学国家研究中心，辽宁沈阳110016；5.中国科学技术大学，材料科学与工程学院，辽宁沈阳110016；6.北京大学量子材料科学中心，北京100871）

摘  要   近年来石墨烯导热膜在高性能手机等电子产品里获得了广泛的应用。通过加热的方式还原氧化石墨烯是一种被应用于石墨烯导热膜批量制备的商业方法，但其原子尺度上的结构演化过程并不很清楚。本文利用球差校正扫描透射电镜原位观测了氧化石墨烯在加热条件下还原的微观结构演化。结果表明，氧化石墨烯在还原初期会由于释放大量气体而形成丝状网络结构，且晶面层间距会随还原进程而减小。经过高温石墨化的还原氧化石墨烯能够具有稳定的结构。本论文的研究揭示了氧化石墨烯在还原过程的微观结构演化，为指导优化还原氧化石墨烯基导热膜的制备和应用提出了有参考价值的信息。

关键词      氧化石墨烯；原位加热；孔洞；层间距；还原氧化石墨烯

中图分类号：O551.3；O482.2；O488；TG115.21+3  文献标识码：A       doi：10.3969/j.issn.1000-6281.2024.05.001

    

In-situtransmission electron microscopy tracking thermal reduction of graphene oxide

BAI Tianqi1，2，3#，HUANG Kun4，5#，DU Jinlong1*，PEI Songfeng4，5*，GAO Peng1，2，3，6*

（1. Electron Microscopy Laboratory, School of Physics, Peking University, Beijing 100871；2. Academy for Advanced Interdisciplinary Studies, Peking University, Beijing 100871；3. Beijing Graphene Institute, Beijing 100095；4.Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang Liaoning 110016；5.School of Materials Science and Engineering, University of Science and Technology of China, Shenyang Liaoning 110016；6. International Center for Quantum Materials, Peking University, Beijing 100871, China）

Abstract  Graphene thermal films are widely used in electronic devices, such as cell phone, due to their ultrahigh thermal conductivity. Heating-induced reduction of graphene oxide is a common commercial method for bulk production of these films. However, the atomic-scale mechanisms behind the structural evolution during the reduction process remain largely unexplored. In this study, we use aberration-corrected scanning transmission electron microscopy (STEM) to observe the microstructural evolution of graphene oxide during in-situ heating. Our findings showed that, upon initial reduction, graphene oxide formed a filamentous network structure due to the release of substantial gas. Additionally, the interlayer spacing decreased progressively as reduction proceeded. When subjected to high-temperature graphitization, the reduced graphene oxide retained a stable structure. This study provides key insights into the structural evolution during the reduction of graphene oxide, offering valuable guidance for optimizing the fabrication of graphene thermal films.

Keywords    graphene oxide; in-situ heating; hole; interlayer spacing; reduced graphene oxide

 

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